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$ sudo smartctl -a /dev/sda
[sudo] password for knightli:
smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.8.0-51-generic] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Ultrastar DC HC550
Device Model: WDC WUH721816ALE6L4
Serial Number: 2BHUKDEN
LU WWN Device Id: 5 000cca 295d9b61a
Firmware Version: PCGNW232
User Capacity: 16,000,900,661,248 bytes [16.0 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 7200 rpm
Form Factor: 3.5 inches
Device is: In smartctl database 7.3/5528
ATA Version is: ACS-4 published, ANSI INCITS 529-2018
SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Fri Jan 24 15:14:57 2025 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 101) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: (1758) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 001 Pre-fail Always - 0
2 Throughput_Performance 0x0005 135 135 054 Pre-fail Offline - 100
3 Spin_Up_Time 0x0007 083 083 001 Pre-fail Always - 350 (Average 350)
4 Start_Stop_Count 0x0012 097 097 000 Old_age Always - 1511
5 Reallocated_Sector_Ct 0x0033 100 100 001 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 001 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 140 140 020 Pre-fail Offline - 15
9 Power_On_Hours 0x0012 097 097 000 Old_age Always - 24995
10 Spin_Retry_Count 0x0013 100 100 001 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 098 098 000 Old_age Always - 148
22 Helium_Level 0x0023 100 100 025 Pre-fail Always - 100
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 4832
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 4832
194 Temperature_Celsius 0x0002 058 058 000 Old_age Always - 36 (Min/Max 16/54)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 100 100 000 Old_age Always - 28
SMART Error Log Version: 1
ATA Error Count: 28 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 28 occurred at disk power-on lifetime: 24824 hours (1034 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 53 20 30 80 60 40 Error: ICRC, ABRT 32 sectors at LBA = 0x00608030 = 6324272
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
35 03 20 30 80 60 40 00 00:01:43.419 WRITE DMA EXT
ef 03 46 00 00 00 00 00 00:01:43.416 SET FEATURES [Set transfer mode]
ef 03 0c 00 00 00 00 00 00:01:43.414 SET FEATURES [Set transfer mode]
ec 00 01 00 00 00 00 00 00:01:43.413 IDENTIFY DEVICE
61 08 00 88 f2 4f 40 00 00:01:43.287 WRITE FPDMA QUEUED
Error 27 occurred at disk power-on lifetime: 24824 hours (1034 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 43 00 00 00 00 00 Error: ICRC, ABRT at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 08 00 88 f2 4f 40 00 00:01:43.287 WRITE FPDMA QUEUED
ec 00 01 00 00 00 a0 00 00:01:42.858 IDENTIFY DEVICE
ec 00 01 00 00 00 a0 00 00:01:42.858 IDENTIFY DEVICE
25 03 10 00 00 00 40 00 00:01:42.526 READ DMA EXT
ef 03 46 30 80 60 00 00 00:01:42.524 SET FEATURES [Set transfer mode]
Error 26 occurred at disk power-on lifetime: 24824 hours (1034 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 53 20 30 80 60 40 Error: ICRC, ABRT 32 sectors at LBA = 0x00608030 = 6324272
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
35 03 20 30 80 60 40 00 00:01:42.402 WRITE DMA EXT
ef 03 46 88 f2 4f 00 00 00:01:42.399 SET FEATURES [Set transfer mode]
ef 03 0c 88 f2 4f 00 00 00:01:42.397 SET FEATURES [Set transfer mode]
ec 08 00 88 f2 4f 00 00 00:01:42.396 IDENTIFY DEVICE
61 08 00 88 f2 4f 40 00 00:01:42.272 WRITE FPDMA QUEUED
Error 25 occurred at disk power-on lifetime: 24824 hours (1034 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 43 00 00 00 00 00 Error: ICRC, ABRT at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 08 00 88 f2 4f 40 00 00:01:42.272 WRITE FPDMA QUEUED
35 03 08 a0 f2 4f 40 00 00:01:42.271 WRITE DMA EXT
ef 03 46 a0 f2 4f 00 00 00:01:42.269 SET FEATURES [Set transfer mode]
ef 03 0c a0 f2 4f 00 00 00:01:42.267 SET FEATURES [Set transfer mode]
ec 03 08 a0 f2 4f 00 00 00:01:42.267 IDENTIFY DEVICE
Error 24 occurred at disk power-on lifetime: 24824 hours (1034 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 53 08 a0 f2 4f 40 Error: ICRC, ABRT 8 sectors at LBA = 0x004ff2a0 = 5239456
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
35 03 08 a0 f2 4f 40 00 00:01:42.272 WRITE DMA EXT
ef 03 46 a0 f2 4f 00 00 00:01:42.269 SET FEATURES [Set transfer mode]
ef 03 0c a0 f2 4f 00 00 00:01:42.267 SET FEATURES [Set transfer mode]
ec 03 08 a0 f2 4f 00 00 00:01:42.267 IDENTIFY DEVICE
35 03 08 a0 f2 4f 40 00 00:00:55.790 WRITE DMA EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
The above only provides legacy SMART information - try 'smartctl -x' for more
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